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New high resolution scanning electron microscope

Structural and textural characterization of materials and surfaces - Support for the development of new products or processes

New high resolution scanning electron microscope

Certech has been active for several years in the development and characterisation of new materials. Identification of micro and nanoparticles has also become a major topic, especially in phamaceuticals, cosmetics and food.
In order to increase its instrumental capabilities, Certech has acquired a new field emission scanning electron microscope (FEG-SEM) equipped with an EDX elemental analyzer.
This high resolution instrument is well adapted to low beam energy observation of polymers, composite or multilayered materials, and various microstructures, inclusions, fibres or nanoparticles.
The presence of a variable pressure chamber is also a major feature for the observation and analysis of insulting materials like polymers, minerals, ceramics, organics and associated contaminants.